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Equipment Description
 
EMCL/SEM Lab - Email Managers  (6 Equipment records) 
  No Image Found Dynacool PPMS A PPMS is used for cryogenic to room temperature measurements of sample magnetic and electrical properties including hall measurements at the most basic, with vibrating sample magnetometry and other more sophisticated measurements available with extra training.

The Quantum Design PPMS represents a unique concept in laboratory equipment: an open architecture, variable temperature-field system, designed to perform a variety of automated measurements. Available measurement options include all required hardware and electronics to immediately begin collecting publication-quality data, while the system is also easily adapted to custom user experiments. Sample environment controls include fields up to ±16 T and a temperature range of 1.9 to 400K. The expandable design enables combining many features in one instrument to make the PPMS the most versatile system of its kind.
  No Image Found JEOL JSM-6610LV The JEOL JSM-6610LV is a scanning electron microscope that can operate in High Vacuum mode or in Low Vacuum mode up to 270 Pa. It can image non-conductive samples directly without conductive coating. Detectors include an Everhart-Thornley detector for High Vacuum , a JEOL Low Vacuum secondary detector, a 3 mode backscatter detector and a 30 mm2 Silicon drift detector EDS detector. The microscope has an IXRF EDS system and a 200 N deformation stage for in-vacuum tension and compression testing. It has 30 x 30 x 30 cm chamber and is equipped with a 5 axis computer controlled positioning system.  Maximum magnification is 300,000.
  No Image Found Pro4 Four Point Probe A four point probe allows for measurement of surface conductivity for thin films in a quick and simple method. You may either measure the surface conductance, or if you know the film thickness you can measure the conductivity.

The Pro4 is designed to meet the demands of research on wafers, thin films, solar cells and a variety of applications.

The Pro4 employs the ASTM F84 in line four-point probe configuration. Dual configuration is also used but may be switched off if not desired. The dual configuration method may be found in the NIST publication 260-131. When calibrated with a NIST traceable standard, the accuracy through the standard range is 1%.

ASTM and NIST standards may be found in the MIT libraries for reference.
  No Image Found Probe Station S-1160 A probe station is a flexible tool used to allow for positioning both low frequency and RF probe tips to contact a fabricated sample. An example use is to measure the ferroelectric properties of a new material, to test the opto-electrical properties of a device using custom laser or LED illumination, or to characterize an antenna.

The Signatone S - 1160 150mm - 200mm Manual Probe System designed for reliable and accurate analytical testing of DC, CV-IV, and High-Power applications.

Attachments include
- Standard single tip probes
- Microwave Probes SP-40A
- Keithly 6221
- Keithly 2182A
- Premier II Ferroelectric Tester
- 8753C Network Analyzer with 85047A S-Parameter Test Set
- Optical Breadboard for attaching lasers/optics
  No Image Found Refund  
  No Image Found Vibrating Sample Magnetometer Standard system for taking cyclic magnetometry data from magnetic materials at room temperature in fields up to 10000 gauss.

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